Microscopies and nanocharacterization techniques

Course objectives

The course provides students with an adequate training support in relation to Physics, including the characteristics and capabilities of the various microscopy techniques (from the electronic to the scanning probe ones), both for R & D and industrial processes in which nanotechnologies are used or in which the knowledge of information and properties up to the atomic scale is required. During the course, adequate basic information on the main spectroscopy techniques able to complete a multiscale characterization of materials/systems of interest (based on the radiation-matter interaction) is also provided . In particular, the course aims to provide students enrolled in the Master’s Degree in Nanotechnology Engineering with the necessary knowledge to enable them to choose the best nanocharacterization techniques and methodologies within the processes and procedures that they will be called to define/design/exploit in the framework of their professional profile. The course provides an essential background about electron optics and electron optical devices aimed at developing a correct approach to electron microscopy, both for scanning methods and transmission electron microscopy. Throughout the course, the basic elements of Physics on the mechanisms at the basis of contrast are provided in order to allow the student to correctly interpret the results. The spectroscopic method on which the main analytical tools are based is described together with a survey of complementary methods of ion scanning microscopy and specimen preparation techniques, in order to ultimately allow students to use these methods in a professional frame. Moreover, the course provides a fundamental knowledge about scanning probe microscopy, atomic force microscopy, scanning tunneling microscopy, scanning near-field optical microscopy. Fundamental aspects of the main techniques based on the aforementioned microscopy methods for the nanometer scale characterization of chemical, structural, mechanical, magnetic, electric, and thermal properties are also provided, aiming to train students to select specific techniques on the basis of specific applications. The training objectives are expressed in terms of Dublin Descriptors in order to describe the knowledge acquired by students, the skills of application and growth in terms of critical skills, communication and in-depth study. With regards to the acquired knowledge and to the increase of the comprehension abilities, the course provides elements able to strengthen the knowledge in the field of micro- and nano-scale investigation methodologies, particularly on optical techniques based on electrons and ions and on scanning probe microscopy methods, allowing students to elaborate or apply original ideas and insert themselves in a context of advanced technologies and in the field of technological research. With regard to the ability to apply the acquired knowledge and the understanding of the connected phenomena, the acquired knowledge provides is meant to provide students with the operative tools to face and solve new and unfamiliar problems concerning the micro- and nanostructural aspects of nanotechnologies, even when they are required to operate in large and interdisciplinary contexts. With regard to the autonomy of judgment, the course provides the scientific elements on which micro- and nano-scale investigation technologies are based: in such context, students are required to make autonomous judgements concerning the interpretation of experimental data and be able to formulate an independent and non-preconceived judgment on the issues in question. The course provides the elements necessary to integrate the knowledge acquired in broader contexts in order to interpret and manage complex situations and provide judgments and interpretations even when partial or incomplete information is available, taking into account the ethical and social aspects connected. With regard to the ability to communicate what has been learned, the course provides both semantic and terminology elements that allow to the student a profitable interaction on the issues themselves and on the methodologies involved, with both the specialists of the sector in the field of professional problems and the non-professional subjects in the context of interlocutions in which the specific skills of the student are basic. With regard to the ability to independently pursue their own training and specialization, the course provides students with the main interpretative tools for subsequent readings and experiences capable of allowing a profitable expansion and focusing of the skills acquired. These competences can be summarized as follows: - Understanding the main nanocharacterization techniques for the physical, chemical and functional properties; in particular, the following techniques will be considered: electron microscopies for the morphological analysis of materials up to the atomic scale; diffractions for the structural analysis of materials; probe microscopies for morphological analyses and for the study of the physical-chemical and functional properties up to the nanometric scale; spectroscopies applied to the study of the functional properties of materials; - Understanding the different radiation-matter interaction mechanisms that can be employed in characterization; - Developing the ability to solve a characterization problem from the meso- to the nanoscale, identifying the appropriate techniques to apply considering a cost-effectiveness analysis. - Being able to evaluate the results achieved and drafting new metrological procedures; - Being able to work in team.

Channel 1
MARCO ROSSI Lecturers' profile

Program - Frequency - Exams

Course program
Transmission Electron Microscopy (TEM) Review of the fundamental principles of geometric optics, focusing on beam propagation, focusing, and image formation, applied to the behavior of electrons within electrostatic and electromagnetic lens systems. Description of the architecture of a transmission electron microscope and its main components (electron source, optical columns, condenser lenses, objective and projector lenses). Analysis of electron–matter interactions and contrast formation processes underlying the different imaging modes: bright field, dark field, and high-resolution transmission electron microscopy (HRTEM). Examination of amplitude and phase contrast mechanisms, the operating conditions that control them, and their effect on image quality. Introduction to the general principles of diffraction, with emphasis on Selected Area Electron Diffraction (SAED) for determining crystallographic parameters, lattice orientations, and symmetry relationships. Methods for image analysis and processing, including filtering, Fast Fourier Transform (FFT), and the identification of defects or local periodicities, to quantitatively correlate morphology, structure, and material properties. Criteria and techniques for thin-sample preparation, with specific attention to beam-sensitive and insulating materials. Applications in industrial, biotechnological, electronic, and advanced materials research. Scanning Electron Microscopy (SEM) Operating principles and instrument architecture. Electron–matter interaction and generation of main signals (secondary electrons, backscattered electrons, X-rays). Topographic and compositional contrast mechanisms and their interpretation. Advanced imaging based on cathodoluminescence (CL) for optical and structural characterization. Preparation of conductive and non-conductive samples and procedures for high-resolution imaging. Applications in materials science, surface analysis, and nanotechnology. Energy-Dispersive X-ray Spectroscopy (EDS) Principles and detector architecture. Qualitative and quantitative analysis of X-ray spectra, calibration, and statistical validation. Applications in TEM and SEM; limitations for light, trace, or thin-film elements. Use of EDS to determine composition, homogeneity, and elemental distributions in complex materials. Scanning Probe Microscopies (SPM) General architecture of probe microscopes. Scanning Tunneling Microscopy (STM) and related spectroscopies for electronic characterization. Atomic Force Microscopy (AFM): principles and modes (contact, tapping, non-contact, phase) with emphasis on surface roughness, morphology, and local property mapping. Other SPMs and their quantitative/qualitative surface applications. Photonic Spectroscopic Techniques Physical principles and applications of Raman and infrared (IR) spectroscopy for identifying phases, functional groups, defects, and stress. Interpretation of vibrational spectra and selection rules. Complementarity of Raman/IR in chemical and structural characterization of inorganic, polymeric, and hybrid materials. Criteria for technique selection by material type, required resolution, and investigation scale. X-ray Based Techniques Fundamentals of X-ray diffraction (XRD) and crystallographic basis; Bragg’s law, diffraction geometries, and peak analysis for lattice parameters, crystallite size, and residual strain. Advanced methods (X-ray reflectometry, texture analysis) for structural and surface characterization. Principles of X-ray computed tomography (XCT): acquisition, 3D reconstruction, and interpretation of volumetric data, distinguishing micro- and nano-tomography. Integration of XRD/XRR/XCT with electron microscopies for multiscale, three-dimensional structural and morphological analysis. Applications in industrial, biomedical, and advanced materials research. Case Studies Practical examples of integrated use of electron microscopy, diffraction, tomography, microanalysis, and spectroscopies for the characterization of complex materials. Multitechnique and multiscale approaches to correlate structure, composition, and functional properties in technologically, industrially, and biomedically relevant systems.
Prerequisites
There are no specific prerequisites that are different or complementary to those required for access to the Master's Degree
Books
- Educational material distributed by the teacher. - Handbook of microscopy for nanotechnology, Kluwer Academic Publishers. - Transmission Electron Microscopy - David B. Williams e C. Barry Carter, Springer Verlag (2009).
Teaching mode
The course is mainly taught through frontal lectures. It consists of 90 hours of lectures, including problems of nanocharacterization in the various application fields.
Frequency
Despite not mandatory, attendance is strongly recommended.
Exam mode
The exam will include: A) a written test focused on the fundamental aspects developed during the course; B) a brief dissertation (in oral or written form) on a topic selected by the student. It is recommended to choose the topic together with a colleague of the course and then develop two different in-depth analyses of the same subject. The work can be presented either as a written short thesis or as an oral presentation with slides. C) an oral exam in which the essay and the written test will be discussed. Students are allowed of 2.5 hours for the written test. Questions aim at verifying the acquisition of the concepts discussed during the course. Moreover, a case study may be presented: in relation to it, the student is asked to elaborate their own proposal of possible experimental approaches. The final mark resulting from the written test is calculated considering the quality of the answers and serves as basis for the final mark assigned after the written dissertation and/or the oral discussion. Overall, the text aims at verifying that students have acquired a good knowledge and understanding of the information given during the classes, not only from a theoretical point of view, but also in relation to simulated practical situations. Students’ capability of autonomous learning is also tested, e.g., by proposing supplementary research material. Capability and autonomy to make judgements and propose solutions to simulated practical problems proposed by the teacher are verified. Finally, communication skills are verified – always taking into account the limitations aroused by the English language, which may be that not “naturally” used by the student. The final evaluation will be based on the following elements: a) understanding of the concepts discussed throughout the course, from both a theoretical and a practical point of view, particularly in relation to simulated characterization problems; b) ability to make autonomous judgements; c) accuracy and critical judgement in the scientific and technological field; d) ability to communicate properly.
Bibliography
S.Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo: Electron Microscopy:Principles and Fundamentals; VCH, 1997, Ray F. Egerton: Physical Principles of Electron Microscopy. An Introduction to TEM, SEM, and AEM.; Springer 2005 V.L. Mironov: Fundamentals of scanning probe microscopy
Lesson mode
The course is mainly taught through frontal lectures. It consists of 90 hours of lectures, including problems of nanocharacterization in the various application fields.
LIVIA ANGELONI Lecturers' profile

Program - Frequency - Exams

Course program
Introduction to Scanning probe microscopy (SPM) Scanning tunneling microscopy (STM) Introduction to atomic force microscopy (AFM) AFM contact mode AFM tapping mode and phase imaging Advanced AFM-based techniques Mechanical characterizations using AFM Force Spectroscopy and Force Spectroscopy Imaging Contact resonance AFM (CR-AFM) Electric characterizations using AFM Magnetic characterizations using AFM Tomography by AFM Scanning near-field optical microscopy (SNOM) Raman Spectroscopy Tip-enhanced Raman spectroscopy (TERS)
Prerequisites
Fundamentals of general physics (mechanics and electromagnetism), chemistry, and mathematics – the level of academic courses of scientific faculties (engineering, physics, chemistry). Advanced knowledges required to understand specific topics of the course are given during the course.
Books
Slides supplied by the teacher Fundamentals of scanning probe microscopy (V.L. Mironov)
Frequency
Attendance at the course is strongly recommended in order to take full advantage of the interaction with the teacher and the collective experiences. However, the documentation provided and the suggested texts make it possible to achieve appropriate training even with limited interaction.
Exam mode
In consideration of the teaching contents and the training objectives which are mainly focused on the acquisition of knowledge, the evaluation methods are based on the assessment of the acquired preparation as well as on the insertion in wider contexts. The elements taken into consideration for the purposes of the assessment are linked to the extent of the knowledge acquired and to their in-depth analysis in terms of technical details and insertion capacity in application-type contexts. The judgment essentially disregards the mode of learning and no preclusion is given to an independent self-training of the student or with a limited interaction with the teacher. To this end, the modality of the final examination, written and oral, without intermediate evaluations appears more suited to the purpose. A written test with a closed stimulus with an open answer is the most suitable tool for assessing the achievement of the training objectives, as the possibility of widening and differentiating the answer to a fixed question allows to highlight the level of deepening of the topic and therefore of consistency in the preparation of the individual student with the training objectives. The integration with an oral test based essentially but not exclusively on the topics of the written test, allows to deepen the assessment of the achievement of the training objective and to refine the assessment of the knowledge acquired and metabolized by the student. In detail, the two-hour written test is based on 6 open-ended questions, 2 of which on probe scanning microscopy and related techniques and 4 on electron microscopy and related techniques. It is requested the elaboration of three topics to choose from, one concerning probe microscopy and two electron microscopy and related techniques. Students who have successfully passed the written exam are admitted to an oral exam in which the topics covered are analyzed, on the basis of which it is also possible to extend the reasoning to other related topics. The tests are carried out at the end of the training course and there are two calls in the summer session, two in the autumn session and two in the winter session.
Lesson mode
Slides by the teacher are shown and explained. Slides are supplied to the students.
  • Lesson code1018601
  • Academic year2025/2026
  • CourseNanotechnology Engineering
  • Curriculum32343-01
  • Year1st year
  • Semester2nd semester
  • SSDFIS/01
  • CFU9